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Published in:   Vol. 6 Issue 2 Date of Publication:   December 2017

An Efficient Ic On chip Test Framework To Embed Tsv Testing In Memory Bist Using Dynamic Technique

G.Vithya,P. Krishnakumar

Page(s):   43-47 ISSN:   2278-2397
DOI:   10.20894/IJBI.105.006.002.004 Publisher:   Integrated Intelligent Research (IIR)


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